集成电路测试用使用到的D算法分析，这是第一篇，很难找的哦！-The use of integrated circuit test analysis of the D algorithm, which is the first chapter, it is difficult to find the Oh!
SHOW FULL COLUMNS FROM `jrk_downrecords` [ RunTime:0.001637s ]
SELECT `a`.`aid`,`a`.`title`,`a`.`create_time`,`m`.`username` FROM `jrk_downrecords` `a` INNER JOIN `jrk_member` `m` ON `a`.`uid`=`m`.`id` WHERE `a`.`status` = 1 GROUP BY `a`.`aid` ORDER BY `a`.`create_time` DESC LIMIT 10 [ RunTime:0.123390s ]
SHOW FULL COLUMNS FROM `jrk_tagrecords` [ RunTime:0.001712s ]
SELECT * FROM `jrk_tagrecords` WHERE `status` = 1 ORDER BY `num` DESC LIMIT 20 [ RunTime:0.003476s ]
SHOW FULL COLUMNS FROM `jrk_member` [ RunTime:0.001739s ]
SELECT `id`,`username`,`userhead`,`usertime` FROM `jrk_member` WHERE `status` = 1 ORDER BY `usertime` DESC LIMIT 10 [ RunTime:0.006063s ]
SHOW FULL COLUMNS FROM `jrk_searchrecords` [ RunTime:0.001662s ]
SELECT * FROM `jrk_searchrecords` WHERE `status` = 1 ORDER BY `num` DESC LIMIT 5 [ RunTime:0.004078s ]
SELECT aid,title,count(aid) as c FROM `jrk_downrecords` GROUP BY `aid` ORDER BY `c` DESC LIMIT 10 [ RunTime:0.015828s ]
SHOW FULL COLUMNS FROM `jrk_articles` [ RunTime:0.001424s ]
UPDATE `jrk_articles` SET `hits` = 1 WHERE `id` = 137646 [ RunTime:0.001178s ]
